2001-2002 Colloquium Series

NAU Physical Sciences (Bldg 19, Rm 321), Thursday, 18 October 2001, 4:00 PM

FROM ANTS TO ATOMS: AN INTRODUCTION TO AND APPLICATIONS OF ELECTRON MICROSCOPY

Nestor J. Zaluzec , Argonne National Laboratory

Abstract

Microscopy is one of the few methodologies applied to nearly every field of science and technology in use today. A microscope can be as simple as a hand-held optical device or as a complex, integral part of a multi-million-dollar research facility. Using these instruments, both scientists and students can explore the synergistic relationships between structure and either properties or function for a wide variety of materials in both the physical and the life sciences.

The various electron microscope incarnations have evolved into a powerful set of tools for studying the morphology, crystallography, electronic, elemental, chemical, and biological structure of materials. In this seminar we will discuss the technology starting with its simplest form, the scanning electron microscope, up to the advanced high-resolution analytical transmission electron microscope. Selected applications that make use of electron column-based microanalaysis to investigate research problems in materials science and physics will illustrate the range of functionality of these instruments.
 

Biography
Nestor J. Zaluzec is currently a research scientist and principal investigator for the Advanced Analytical Electron Microscopy and TelePresence Collaboratory Projects in the Materials Science and Mathematics and Computational Science Divisions of Argonne National Laboratory. He is also an adjunct professor of physics at both the University of Illinois at Chicago and Northern Illinois University. He received a B.S. in Physics from Illinois Institute of Technology in 1973 and a Ph.D. in metallurgy from the University of Illinois - Champaign-Urbana in 1978.

Dr. Zaluzec's main research interests are divided into both research and development as well as applications to materials science, including: microcharacterization of materials via Analytical Electron Microscopy and related techniques. He is a member of numerous societies, is on the editorial board of three journals, and has lead more than 25 short courses in various aspects of electron microscopy in the U.S., Europe, Asia and Australia. He also spends a modicum of time on the Net in various roles as SysOp for resources for the microscopy community worldwide. On a good day you might also find him in the Telepresence Microscopy Collaboratory at http://tpm.amc.anl.gov

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